Call For Papers

Call for papers as PDF and text

We invite submissions of high-quality papers in three categories below:

  • Research papers (up to 10 pages)
  • Industrial experience reports (up to 6 pages)
  • Emerging idea proposals (up to 6 pages)

Research papers require both original work and quantitative evaluation. Industrial experience reports require practical insight or actual improvement in industry as well as (quantitative if possible) evaluation. Emerging idea proposals require vision, perspective, concept, new idea, new research theme proposal and cross-technical discussion around test architecture design.

All papers must conform to IEEE's format: http://www.ieee.org/conferences_events/conferences/publishing/templates.html

Workshop papers will be published in the IEEE Digital Library in the form of a post-proceedings.

Topics of interest for papers include, but are not limited to:

  • Concepts of test architectures
    • Abstraction of test cases (e.g. test levels, test types, abstract equivalent classes, high-level test conditions and high-level test cases)
    • Relationships of abstract test cases
    • Separation of concerns for test
    • Architecture of test suite based on abstract test cases (e.g. design of test levels and test types)
    • Types of test architecture (e.g. architecture of test suite and architecture of test system/environment)
    • Similarities, differences and harmonization between test suite architecture and test system architecture
    • Similarities and differences among test architecture, test strategy, test plan and test sub-process in 29119

  • Design of test architecture
    • How to design several test levels
    • How to design complicated test types and test cycles
    • Design concepts for test architecture design
    • Modeling technique for test architecture design
    • Design patterns for test architecture design
    • Styles of test architecture
    • Quality characteristics of test architecture (e.g. maintainability of test suite)
    • Original diagrams and notation for test architecture design
    • Application or enhancement of existing notation (e.g. UML/UTP, SysML and future diagram for SPL)
    • Connection of test architecture design and test case design (e.g. structure of test case based on test architectural components)
    • Meta-models or ontology for test architectures

  • Test requirement analysis
    • Whether software requirement specification is the goal of software test or not?
    • How to model holistic test requirement
    • How to model non functional requirement for test
    • How to organize test requirement for several source (e.g. from customer, from design and from environment)
    • How to overview large-scale and complex requirements for test
    • Analysis patterns for test requirement analysis

  • Application of test architecture
    • Quality evaluation of test architecture
    • Overall test engineering methodology based on test architecture design
    • Reuse of test architecture design
    • Product line engineering of test suite (e.g. how to design and manage variants of test suite)
    • Design example of test architecture for large-scale and complicated system
    • Roles and responsibilities of test architect
    • Automation based on test architecture (e.g. separating automated test and manual test in keyword driven testing based on test architecture)
    • Test process improvement based on test architecture
    • Relationships between software architectures and software test architectures
    • Typical test architecture for a domain and/or comparison among domains (e.g. banking, logistics, cloud, automotive, medical, industrial automation and telecommunications)
    • Industrial experiments and case studies of test architectures